- 101097 Series probes
- 0.200" centers
- 50 Ω impedance
- Compliant on both ends
- Bandwidths of 3 GHz for coax probes with shielding plungers
- Bandwidths of 500 MHz for non-shielded designs
- IDI Spring Probe technology
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Smiths Interconnect awards top distributors for 2022
The distribution award initiative recognizes and celebrates the business partners whose efforts have contributed to advancing Smiths Interconnect’s business respectively in the Americas, EMEA and Asia. Winners were selected as best performing distributors in terms of sales growth compared to the previous year.
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Introducing the next generation of high-speed test solutions
Smiths Interconnect announces the expansion of its DaVinci Series to incorporate DaVinci 112 - ideal for testing some of the most complex functionality of Application Specific Integrated Circuits (‘ASICs’).
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Kelvin Probes Provide First-Class Performance for High-volume Final Test of Standard Array and Wafer-level Devices
The unique beveled tip provides reliable, stable contact resistance for applications where chip test is critical, such as IoT, Mobile, Internet, and Automotive.
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Volta Product Pushes Testing Technology Boundaries
A High Performance, Cost-effective Alternative in Wafer Level Chip Scale Package Testing