- Low loss, low back reflection
- General use design (no strain relief backshell needed)
- Optical disconnect style available: Standard 1.25 mm ferrule and sleeve
- Cable termination identical to LC connector process
- Easy cleaning access to the contact through removable alignment sleeve holder
- Standard ARINC 600 Size 16 insertion/removal tool
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DIN Contacts
Features of the Fiber optic DIN contacts are: twist protection pin, Multimode applications, Screw lock mechanism, Low insertion loss -0.20dB (typically)
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New Volta 180 supports Wafer Level Packages and Known Good Dies test businesses
The new Volta 180 Series is an advanced WLCSP test solution that expands Volta product line to include the compact 180um pitch, allowing for a higher number of chips to be tested on each wafer. It allows for a fast and reliable testing of wafers to ensure that they meet specifications and perform as they should, which translates into higher quality end products.
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Rethinking Blind Mate Connectors to Increase Reliability in Miniaturized Electronics Assembly
Creating more compact electronic components with higher functionality is a challenge for all electronics manufacturers. Whatever industry you're in, creating consumer, business, or military-grade electronics, the challenge presents itself, and the stakes are high. As electronics are expected to continue shrinking while increasing capabilities, blind mating connectors are required to meet those same size and functionality requirements.
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Test Laboratory Expansion in Suzhou
The Centre of Excellence will offer a one-stop-shop to the global customer base for the products used in semiconductor test applications.
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Next Generation DaVinci 56 Test Socket
Coaxial Test Solution for IC Testing to 67 GHz / 56 Gbps