- High insertion life
- Suited for blind mate connections
- Low profile, high compliance ratio
- Ideal for high shock and vibration environments
Spring probe techology in custom connectors
Spring probe techology utilized in custom connector designs. Mixed signals and functionality can be designed into a single connector.
In the realm of medical technology, where precision and innovation intersect, the quest for excellence becomes an unyielding pursuit. When dealing with the design of interconnect systems for the medical industry, the level of engineering attention and engagement required to develop a top performance product is very high.
The new Volta 180 Series is an advanced WLCSP test solution that expands Volta product line to include the compact 180um pitch, allowing for a higher number of chips to be tested on each wafer. It allows for a fast and reliable testing of wafers to ensure that they meet specifications and perform as they should, which translates into higher quality end products.
A High Performance, Cost-effective Alternative in Wafer Level Chip Scale Package Testing
To extend the life of your probes and lower the overall cost of testing, consider the following steps.