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Monet Probe Heads

Monet Series

Proprietary embedded barrel spring pin technology allows the best in class electrical and mechanical performance. Higher parallelism for greater throughput. Individually replaceable cartridge design allows minimal downtime. Optimized design of Fan out PCB to insure best signal integrity.

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Applications

Semiconductor

  • Wafer Level Test: Bluetooth
  • Wafer Level Test: Wi-Fi
  • Wafer Level Test: Power Management
Semiconductor Overview

Features & Benefits

Monet offers all of the conventional advantages of spring probe technology, with an innovative design that permits robust contact on pitches as fine as 180 µm. Featuring a conventional double-plunger probe design, Monet?s radically thin, embedded barrel concept enables low contact resistance, granting excellent DC test performance and very high current ratings with respect to the probe head?s pitch. The patent pending Monet solution allows for the robustness, replaceability and compliance of the spring probe while also addressing the fine pitches and coplanarity required for WLCSP.

  • Reliable RF signal integrity
  • Excellent compliance and contact force
  • Easy maintenance

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