Tag Results
3 Results
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08 May
One-stop-shop laboratory replicates deep space environment
Space flight hardware is exposed to severe shock, vibration, thermal variations and electromagnetic environments that start with launch and continue throughout its operational lifetime. Environmental tests expose the hardware to these environments in a simulation laboratory to validate the design, screen for manufacturing defects and ensure the reliability and survivability of flight hardware.
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01 May
Raising the Bar of Burn-In Testing Sockets
Burn-in testing is widely used as an aid in producing failure-free electronic components. When scientifically planned and conducted, burn-in-testing sockets offer one of the most effective methods of reliability screening at the component level. Testing during production plays a vital role in ensuring reliability and repeatability. Semiconductor manufacturing plants perform tests at each stage of production to eliminate defective parts as early as possible while precisely controlling each process parameter of the chip.
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14 Dec
Accelerating Device Bring-Up and Production Ramp for WLCSP 5G Mobile IC’s
As mobile phone electronics continue to shrink, WLCSP has become the de-facto packaging solution for IC’s going into today’s flagship handsets. Manufacturers need solutions to rapidly debug their new silicon, and quickly ramp it to HVM while achieving aggressive DPPB quality levels.