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Showing all results for: "IDI"

Showing 281 results

Tactical Global Positioning System (GPS)

Smiths Interconnect's Model 8836 series Tactical GPS Time and Frequency System is suited for SATCOM wireless ruggedized military applications where Size Weight and Power (SWaP) is critical.

/products/rf-subsystems-and-assemblies/time-and-frequency-systems/tactical-global-positioning-system-(gps)/

GPS Clocks

Smiths Interconnect's series of GPS disciplined clocks are high performance time and frequency references for applications requiring upmost system accuracy.

/products/rf-subsystems-and-assemblies/time-and-frequency-systems/gps-clocks/

Modular Systems

Smiths Interconnect's modular Time and Frequency Systems are built around a base unit that offer dual-redundant modular unit designed for high reliability applications requiring uninterruptable 24-7 service.

/products/rf-subsystems-and-assemblies/time-and-frequency-systems/modular-systems/

Distribution Systems

Smiths Interconnect's Frequency and Time Code Signal Distribution Systems are specifically designed for a wide variety of signal distribution applications including sine wave, time code, and digital signals.

/products/rf-subsystems-and-assemblies/time-and-frequency-systems/distribution-systems/

Up/Down Frequency Converters

Smiths Interconnect's high performance frequency block upconverters, and block downconverters are specifically designed for airborne satellite communications, data links, point to point radio links, and radar applications.

/products/rf-subsystems-and-assemblies/integrated-microwave-assemblies/up-down-frequency-converters/

Array High Speed Test

Controlled impedance socket using individually replaceable spring pins. Socket is built with proprietary insulated metal with least deflection to accommodate large IC packages. Low and stable contact resistance and 3A current carrying capacity per pin. 40GHz/26Gbps performanc...

/products/semiconductor-test/test-sockets/array-high-speed-test/

Peripheral Strip Test

Highly reliable multi site strip test socket . Customized design to suite any strip test handler. High parallelism offers higher throughput.

/products/semiconductor-test/test-sockets/peripheral-strip-test/

Peripheral Tri-Temp Test

5A continues current carrying capacity and capable -50 to 170deg C test environment. Proprietary contact design with wiping action at device pad to ensure consistent contact resistance. Minimal scrub action to the PCB pad.

/products/semiconductor-test/test-sockets/peripheral-tri-temp-test/

Monet Probe Heads

Proprietary embedded barrel spring pin technology allows the best in class electrical and mechanical performance. Higher parallelism for greater throughput. Individually replaceable cartridge design allows minimal downtime. Optimized design of Fan out PCB to insure best signa...

/products/semiconductor-test/wlcp-probe-heads/monet-probe-heads/

Standard Array & Peripheral Test

Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test application. Wide selection of Smiths Interconnects spring pins with low and stable contact resistance. World class design, Lab and manufacturing facility to ensure consistence product ...

/products/semiconductor-test/test-sockets/standard-array-peripheral-test/