Battery Contacts and Dovetail Connectors

Featuring C Series Spring Probes, renowned for their incomparable shock and vibration performance, housed in a patented block design.

Spring Probe Connector makes the Connection to Digital X-Ray Detector

Smiths Interconnect worked with the manufacturer’s design team to modify the design to provide additional alignment and retention of the magnet latch connectors for the medical detectors.

Advanced Thermal Management IC Test Solutions

Utilizing state-of-the-art system simulation models allows Smiths Interconnect to optimize each lid’s design for efficient heat dissipation through a variety of cooling mechanisms.

Smiths Interconnect unveils 2023 Distributors of the Year

The distribution awards initiative celebrates business partners who have contributed to the growth of Smiths Interconnect's business across the 3 regions in which it operates: Americas, EMEA and Asia.

Raising the Bar of Burn-In Testing Sockets

Burn-in testing is widely used as an aid in producing failure-free electronic components. When scientifically planned and conducted, burn-in-testing sockets offer one of the most effective methods of reliability screening at the component level. Testing during production plays a vital role in ensuring reliability and repeatability. Semiconductor manufacturing plants perform tests at each stage of production to eliminate defective parts as early as possible while precisely controlling each process parameter of the chip.