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Integrated test solutions for 5G, data centers, and high-speed test applications

Now Available on Demand

The rapid expansion of connected devices and data-intensive applications is driving the growing demand for highly efficient and adaptive high-performance computing solutions. Mobile devices such as cell phones, tablets and car infotainment systems have the most sophisticated System-on-Chip (SoCs) ever produced. Testing these devices in full functionality requires comprehensive understanding of the impact the interconnect has on the signal path to address high speed signaling and critical device power requirements. Beyond these requirements, how to ensure these SoCs to function with exceptional reliability and accuracy?

This presentation will walk you through how Smiths Interconnect’s high performance test solution helps to accomplish two goals:

  • Provide an integrated test solution to meet the required device specification, so the products full functionality can be tested. 
  • Ensure an out-of-the-box solution for high yield production testing to meet time-to-market pressures

Key Takeaways

  • High speed test challenges overview 
  • Highlights of high speed test sockets series and how they meet the most demanding power/performance requirements for smart applications, including wearables, data centers and autonomous vehicles