The web site is now storing only essential cookies on your computer. If you don't allow cookies, you may not be able to use certain features of the web site including but not limited to: log in, buy products, see personalized content, switch between site cultures. It is recommended that you allow all cookies. View our cookie policy here.

Semiconductor Test

World’s most comprehensive offering of spring probe based solutions, including: contacts, connectors, interposers, semiconductor test sockets, and ATE interfaces. Proven offthe- shelf and custom products deliver the best solution for the customer’s specific application.

Semiconductor Test
Back to Products Home
Capabilities

Capabilities

In-house capabilities encompass design, development, manufacturing and testing. Providing operational excellence tailored to volume manufacturing requirements, global sourcing, world class engineering talent and rapid prototyping.

Quality

Quality

We foster a Culture of Quality to be the best at what we do ... Quality, it is all about the Customer.

  • List View
  • Simple List View
  • Grid View
Showing 8 Products
Array High Speed Test

Array High Speed Test

Controlled impedance socket using individually replaceable spring pins. Socket is built with proprietary insulated metal with least deflection to accommodate large IC packages. Low and stable contact resistance and 3A current carrying capacity per pin. 40GHz/26Gbps performance.

Array PoP Test

Array PoP Test

Highly precised top and bottom array simultaneous test capable socket for effective package on package test. Customized socket design is capable to test high speed signals in lab, engineering, SLT and ATE applications. Controlled impedance loop-back with PCB for high speed signal integrity.

Monet Probe Heads

Monet Probe Heads

Proprietary embedded barrel spring pin technology allows the best in class electrical and mechanical performance. Higher parallelism for greater throughput. Individually replaceable cartridge design allows minimal downtime. Optimized design of Fan out PCB to insure best signal integrity.

Peripheral Strip Test

Peripheral Strip Test

Highly reliable multi site strip test socket . Customized design to suite any strip test handler. High parallelism offers higher throughput.

Peripheral Tri-Temp Test

Peripheral Tri-Temp Test

5A continues current carrying capacity and capable -50 to 170deg C test environment. Proprietary contact design with wiping action at device pad to ensure consistent contact resistance. Minimal scrub action to the PCB pad.

Silmat® Elastomeric Test Socket

Silmat® Elastomeric Test Socket

Extremely short signal path and capable to handle >40GHz. Customized test socket design for lab, engineering, SLT and ATE tests.

Standard Array & Peripheral Test

Standard Array & Peripheral Test

Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test application. Wide selection of Smiths Interconnects spring pins with low and stable contact resistance. World class design, Lab and manufacturing facility to ensure consistence product performance with highest customer satisfaction. Highly competitive price and global support.

Volta Series Probe Heads

Volta Series Probe Heads

Individually replaceable spring pin solution with optimized contact force and co-planarity. Low and stable contact resistance and longer compliance allows higher parallelism Proprietary rigid engineering plastic for low deflection and longer probe head life. Customized footprint, field maintainable Probe head.

Who We Are

Who We Are

Smiths Interconnect is a leading provider of technically differentiated electronic components, subsystems, microwave and radio frequency products that connect, protect and control critical applications in the commercial aviation, defense, space, medical, rail, semiconductor test, wireless telecommunications, and industrial markets.

Learn More
Copyright © 2019 Smiths Interconnect. All Rights Reserved.