Array High Speed Test - DaVinci 112
DaVinci 112 increases production yields and throughput, eliminating false faults and complete functional failures.
Array High Speed Test - DaVinci Micro Test Socket
Fully shielded signal path negates the effects of cross-talk during test, allowing an immediate yield enhancement.
Array High Speed Test - DaVinci Series
Innovative IM material to permit a truly coaxial structure from tip to tip allowing for industry leading yields in a highly compliant contactor.
Array PoP Test
Designed with the benefit of a variety of verification tools to ensure simultaneous engagement and alignment to both sides of the package.
Galileo Test Socket
Innovative, low-profile test socket that provides outstanding electrical and mechanical performance for IC test customers who need a cost effective, rapid delivery solution.
Kepler Test Socket
Contact technology combines the scrub motion of a cantilever contact with the versatility and modularity of a spring probe.
Peripheral Strip Test
Highly reliable multi site strip test socket . Customized design to suite any strip test handler.
Peripheral Tri-Temp Test
Celsius test sockets feature a wiping contact technology perfect for QFN testing.
Silmat® Elastomeric Test Socket
Extremely short signal path and capable to handle >40GHz. Customized test socket design for lab, engineering, SLT and ATE tests.
Standard Array & Peripheral Test
Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test applications.
Thermal Management Lid Capabilities
Thermal Management Lid solutions are high value variations, including air-chilled or liquid cooled technology, capable of dissipating up to 650 Watts.