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Standard Array & Peripheral Test

Standard Test socket

Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test application. Wide selection of Smiths Interconnects spring pins with low and stable contact resistance. World class design, Lab and manufacturing facility to ensure consistence product performance with highest customer satisfaction. Highly competitive price and global support.

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Applications

Semiconductor

  • Area Array Test
  • Package on Package Test
  • Wafer Level Test
  • Peripheral Package Test
Semiconductor Overview

Features & Benefits

Smiths Interconnect is a leader in the design and manufacture of test sockets for array applications. We have an extensive portfolio of contact probes and design standards allowing for flexbility, cost effectivity and rapid delivery.

  • Easily configurable
  • Field maintainable
  • Entire signal path shielded

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