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Array High Speed Test - DaVinci Gen V

The next generation of high-performance semiconductors—from advanced Consumer SoCs and GPUs to AI Accelerators and Data Center processors  demands unprecedented bandwidth and speed. Yet as data rates climb, ensuring signal integrity during testing becomes exponentially more difficult. Even slight impedance mismatches or signal degradation can trigger false failures, compromise yields, and delay critical product launches.

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Features & Benefits

Engineered to overcome these challenges, the DaVinci Gen V coaxial test socket provides an out-of-box solution for full functional testing of cutting-edge ASICs. Its precision design guarantees unmatched signal integrity, eliminating measurement errors while delivering lab-grade accuracy and repeatability in production environments.

Product features:

  • Solution for BGA, LGA and other variants
  • Spring probe technology using homogeneous alloy with gold plated for better grounding
  • RF bandwidth > 84 GHz @ -1dB IL  
  • Short signal path  4.90 mm test height 
  • Impedance tuned to match system 
  • Consistent stable contact resistance 55 mΩ (Avg.)
  • Hi-coplanarity accommodation 
  • Tri-temp socket design to support -55 °C to +150 °C
  • Designed for manual test, bench test, and HVM production test using the same socket
  • New manufacturing process to top and bottom cartridge

Benefits:

  • Design adaptation to meet requirement
  • Long contact life, tested to 500K insertions  
  • Impedance can match system or defined as needed 
  • Excellent DC performance
  • Patented insulated metal socket housing for optimal signal integrity performance and strength
  • Precision-machined socket housing ensures robust mechanical performance 
  • Field repairable, replace a single probe or full array
  • Cleaning can be done while the system is running, using a cleaning surrogate 

 

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