Custom Spring Probe Interposers

Spring probe technology in custom connectors

Spring probe technology utilized in custom connector designs. Mixed signals and functionality can be designed into a single connector.

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High insertion life
Suited for blind mate connections
Low profile, high compliance ratio
Ideal for high shock and vibration environments

New Volta 180 supports Wafer Level Packages and Known Good Dies test businesses

The new Volta 180 Series is an advanced WLCSP test solution that expands Volta product line to include the compact 180um pitch, allowing for a higher number of chips to be tested on each wafer. It allows for a fast and reliable testing of wafers to ensure that they meet specifications and perform as they should, which translates into higher quality end products.
Probe Life – Board Test Probes: A Comprehensive Guide

To extend the life of your probes and lower the overall cost of testing, consider the following steps.
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Coaxial Test Solution for IC Testing to 67 GHz / 56 Gbps