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Double-Ended / Wireless Test Receptacles

Designed for mixed center PCB test. The receptacles have replaceable probes on both sides and are designed for more general purpose wireless connections.

Double-Ended / Wireless Test Spring Probes

Double-ended probes feature both a top-side and bottom-side compliant plunger. Double-ended receptacles are available with a permanent bottom-side plunger and a replaceable probe on the top side.

Double-Ended Coaxial Probe

Double-Ended Coaxial Probe. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.

Switch Probes

SW-3, SW-4 and SW-5 Series probes

Thermocouple Probes

The thermocouple probe's unique design ensures that the wires are internally fixed. This is done to prevent the two thermocouple wires from becoming dislodged from the plunger head cavity.

Interface Pin

Variety of interface pins for use in test fixtures.

Array PoP Test

Designed with the benefit of a variety of verification tools to ensure simultaneous engagement and alignment to both sides of the package.

Array High Speed Test - DaVinci Series

Innovative IM material to permit a truly coaxial structure from tip to tip allowing for industry leading yields in a highly compliant contactor.

Standard Array & Peripheral Test

Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test applications.

Peripheral Strip Test

Highly reliable multi site strip test socket . Customized design to suite any strip test handler.

Peripheral Tri-Temp Test

Celsius test sockets feature a wiping contact technology perfect for QFN testing.

Volta Series Probe Head

High performance, cost-effective, easily maintainable alternative to cantilever and vertical probe card technologies.

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