37 Results
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Volta Series Probe Head
High performance, cost-effective, easily maintainable alternative to cantilever and vertical probe card technologies.
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Array High Speed Test - DaVinci Micro Test Socket
Fully shielded signal path negates the effects of cross-talk during test, allowing an immediate yield enhancement.
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0.075" Centers
Standard probe series for 0.075" (1.91 mm) pitch includes multiple length, travel, ICT, lead free and rotator options.
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Double-Ended Coaxial Probe
Double-Ended Coaxial Probe. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.
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Array High Speed Test - DaVinci Series
Innovative IM material to permit a truly coaxial structure from tip to tip allowing for industry leading yields in a highly compliant contactor.
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0.100" Centers
Standard probe series for 0.100" (2.54 mm) pitch includes multiple length, travel, ICT, lead free and rotator options.
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Standard Spring Probes
Spring probes provide reliable electro-mechanical performance through hundreds of thousands of cycles. They are available in a variety of sizes, spring forces and terminations.
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Custom Spring Probe Connectors
The benefits of Smiths Interconnect's spring probe technology specifically designed for your application.
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Array PoP Test
Designed with the benefit of a variety of verification tools to ensure simultaneous engagement and alignment to both sides of the package.
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0.100" Centers High Current
The SH Series features a bias ball and the SHE Series features a bias spring.
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0.125" Centers
Standard probe series for 0.125 (3.18) pitch includes multiple length and travel options.
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Custom Spring Probe Interposers
Spring probe techology utilized in custom connector designs. Mixed signals and functionality can be designed into a single connector.