37 Results
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Galileo Test Socket
Innovative, low-profile test socket that provides outstanding electrical and mechanical performance for IC test customers who need a cost effective, rapid delivery solution.
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0.156" & 0.187" Centers
Standard probe series for 0.156" (3.96 mm) and 0.187" (4.75 mm) pitches includes multiple length and travel options.
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Battery Contacts and Dovetail Connectors
Featuring C Series Spring Probes, renowned for their incomparable shock and vibration performance, housed in a patented block design.
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Kepler Test Socket
Contact technology combines the scrub motion of a cantilever contact with the versatility and modularity of a spring probe.
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0.125" Centers High Current
0.125" Centers High Current. The SH Series features a bias ball and the SHE Series features a bias spring.
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0.187" & 0.300" Centers
standard probe series for 0.187" (4.75 mm) and 0.300" (7.62 mm) pitches includes multiple length and travel options.
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Levan Elastomeric Contact Test Socket
The Levan Elastomeric socket family is engineered specifically with precision. The elastomeric grid of Levan features conductive columns that guarantee accurate and consistent test results across a spectrum of devices.
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Peripheral Strip Test
Highly reliable multi site strip test socket . Customized design to suite any strip test handler.
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0.156" & 0.187" Centers High Current
High Current Probes 0.156" and 0.187" Centers. The SH Series features a bias ball, which is the most aggressive biasing technique to aid in assuring a low and consistent resistance, cycle after cycle.
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Peripheral Tri-Temp Test
Celsius test sockets feature a wiping contact technology perfect for QFN testing.
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0.187" Centers High Current
High Current Probes 0.187" Centers. The SH Series features a bias ball and the SHE Series features a bias spring.
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Standard Array & Peripheral Test
Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test applications.